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Ok...ran the Seagate Diagnostic "full" test and the drive passed with no
errors.  Is this a sufficient guarantee that the drive is good?  I don't
want to miss out on being able to return it if it's not.  For further
information, here's what S.M.A.R.T has to say about it:

----------------------------
$ sudo smartctl -a /dev/hda
smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen
Home page is <a  rel="nofollow" href="http://smartmontools.sourceforge.net/";>http://smartmontools.sourceforge.net/</a>

=== START OF INFORMATION SECTION ===
Device Model:     ST3120026A
Serial Number:    5JT5H6NQ
Firmware Version: 8.01
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   6
ATA Standard is:  ATA/ATAPI-6 T13 1410D revision 2
Local Time is:    Sun Jun  5 20:10:19 2005 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82) Offline data collection activity
                                        was completed without error.
                                        Auto Offline Data Collection:
Enabled.
Self-test execution status:      (   0) The previous self-test routine
completed
                                        without error or no self-test has
ever
                                        been run.
Total time to complete Offline
data collection:                 ( 430) seconds.
Offline data collection
capabilities:                    (0x5b) SMART execute Offline immediate.
                                        Auto Offline data collection
on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   1) minutes.
Extended self-test routine
recommended polling time:        (  85) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED 
WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   068   062   006    Pre-fail  Always  
    -       109071597
  3 Spin_Up_Time            0x0003   096   096   000    Pre-fail  Always  
    -       0
  4 Start_Stop_Count        0x0032   100   100   020    Old_age   Always  
    -       0
  5 Reallocated_Sector_Ct   0x0033   100   100   036    Pre-fail  Always  
    -       0
  7 Seek_Error_Rate         0x000f   066   060   030    Pre-fail  Always  
    -       4123130
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always  
    -       543
 10 Spin_Retry_Count        0x0013   100   100   097    Pre-fail  Always  
    -       0
 12 Power_Cycle_Count       0x0032   100   100   020    Old_age   Always  
    -       21
194 Temperature_Celsius     0x0022   037   040   000    Old_age   Always  
    -       37
195 Hardware_ECC_Recovered  0x001a   068   062   000    Old_age   Always  
    -       109071597
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always  
    -       0
198 Offline_Uncorrectable   0x0010   100   100   000    Old_age   Offline 
    -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always  
    -       0
200 Multi_Zone_Error_Rate   0x0000   100   253   000    Old_age   Offline 
    -       0
202 TA_Increase_Count       0x0032   100   253   000    Old_age   Always  
    -       0

SMART Error Log Version: 1
ATA Error Count: 1
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It &quot;wraps&quot; after 49.710 days.

Error 1 occurred at disk power-on lifetime: 519 hours (21 days + 15 hours)
  When the command that caused the error occurred, the device was active
or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 32 ec 12 e0  Error: UNC 8 sectors at LBA = 0x0012ec32 = 1240114

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 32 ec 12 e0 00      18:59:19.206  READ DMA EXT
  35 00 08 fa 36 f9 e0 00      18:59:18.933  WRITE DMA EXT
  35 00 08 fa 14 fe e0 00      18:59:18.912  WRITE DMA EXT
  35 00 88 72 14 fe e0 00      18:59:18.909  WRITE DMA EXT
  35 00 08 0a c8 bf e0 00      18:59:18.892  WRITE DMA EXT

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining 
LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%       540      
  -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.




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